Publications

Export 1 results:
Filters: Keyword is optimal pattern  [Clear All Filters]
Conference Paper
Benoit, A., A. Cavelan, Y. Robert, and H. Sun, “Optimal Resilience Patterns to Cope with Fail-stop and Silent Errors,” 2016 IEEE International Parallel and Distributed Processing Symposium (IPDPS), Chicago, IL, IEEE, May 2016.  (603.58 KB)